How I customize self attention layer for identifying wafer defects?
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Sharith Dhar
il 13 Lug 2024
Commentato: Sharith Dhar
il 15 Lug 2024
how I used customize multi head self attention in the CNN network for detecting wafer defects ? please explain with example
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Shantanu Dixit
il 15 Lug 2024
Hi Sharith,
It is my understanding that you want to add and customize self-attention in the CNN network for detecting wafer defects.
You can define a CNN-based architecture and add a self-attention layer in the end using ‘selfAttentionLayer’. The function takes in two parameters, i.e, ‘NumHeads’ and ‘NumKeyChannels’ using which you can change the number of heads and the dimensions of key vector.
Below is a reference code for the model architecture:
layers = [
imageInputLayer([28 28 1], 'Name', 'input')
convolution2dLayer(3, 16, 'Padding', 'same', 'Name', 'conv1')
batchNormalizationLayer('Name', 'bn1')
reluLayer('Name', 'relu1')
maxPooling2dLayer(2, 'Stride', 2, 'Name', 'maxpool1')
convolution2dLayer(3, 32, 'Padding', 'same', 'Name', 'conv2')
batchNormalizationLayer('Name', 'bn2')
reluLayer('Name', 'relu2')
flattenLayer('Name', 'flatten')
selfAttentionLayer(4, 32, 'Name', 'self_attention')
fullyConnectedLayer(10, 'Name', 'fc')
softmaxLayer('Name', 'softmax')
classificationLayer('Name', 'output')
];
The above code defines a CNN based architecture incorporating Multi headed self-attention (MHSA) for ten class classification.
Refer to the below MathWorks documentation for more information:
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